Title :
SPICE simulation of electro-thermal effects in new-generation multicellular VDMOS transistors
Author :
d´Alessandro, V. ; Frisina, F. ; Rinaldi, N.
Author_Institution :
Dept. of Electron. & Telecommun. Eng., Naples Univ., Italy
fDate :
6/24/1905 12:00:00 AM
Abstract :
In this paper a novel SPICE-based simulation tool is presented, suitable to describe the steady-state electro-thermal behavior of new-generation multicellular VDMOS transistors for low-voltage applications. Compared to similar approaches, the proposed one presents substantial improvements: (a) a new electrothermal sub-circuit representation for the elementary transistor is used, which provides an accurate prediction of device characteristics over the temperature range [300 K-400 K] also in quasi-saturation operating mode; (b) the thermal network accounts for both self-heating and thermal interaction effects, is based solely on layout data and is automatically generated; (c) non linear thermal phenomena and layout effects are taken into account.
Keywords :
MOSFET; SPICE; digital simulation; semiconductor device models; 300 to 400 K; SPICE simulation; electro-thermal effects; layout effects; low-voltage applications; multicellular VDMOS transistors; nonlinear thermal phenomena; quasi-saturation operating mode; self-heating effects; steady-state electro-thermal behavior; sub-circuit representation; thermal interaction effects; thermal network; Character generation; Distributed computing; Electrothermal effects; MOSFET circuits; Power MOSFET; Power system modeling; Power transistors; SPICE; Temperature distribution; Thermal conductivity;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003174