Title :
Analysis and design of superjunction power MOSFET: CoolMOS™ for improved on resistance and breakdown voltage using theory of novel voltage sustaining layer
Author :
Kondekar, P.N. ; Patil, M.B. ; Parikh, C.D.
Author_Institution :
Dept. of Electr. Eng., IIT Bombay, India
fDate :
6/24/1905 12:00:00 AM
Abstract :
In this paper, we have observed that the drift layer of conventional power device can be modified to SJ-drift layer for improvement in the breakdown voltage (BV). Doping level of SJ-drift layer increased by one order of magnitude gives at least 5 times improvement in on resistance Ron, without reducing the BV. Further increase in the BV is possible by increasing the thickness of the SJ-drift layer where we observed the proportional increase in Ron. Theory of novel voltage sustaining layer (SJ-theory) recently published is used for the first time to analyze and design CoolMOS structure. We observed that for a fixed cell-pitch, increasing the height of drift layer proportionately increases the BV. The rate of increasing BV is higher for smaller cell-pitch. The Ron also increases proportionally. For a fixed geometry increasing doping level by one order of magnitude reduces the BV and the rate of reduction of this BV is dependent on the cell-pitch.
Keywords :
power MOSFET; semiconductor device breakdown; semiconductor device models; CoolMOS; SJ-drift layer; breakdown voltage; fixed cell-pitch; fixed geometry; on resistance; superjunction power MOSFET; voltage sustaining layer; Breakdown voltage; Diodes; Doping; Electric breakdown; Geometry; Low voltage; MOSFET circuits; Power MOSFET; Rain; Solid modeling;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003176