Title :
Design and implement of a straight coupled transmission line cell for generating dominant E/H-field
Author :
Jeon, Sangbong ; Park, Seungkeun
Author_Institution :
Radio Technol. Res. Dept., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
The operating characteristics of the dominant E-mode and dominant H-mode were investigated using a newly developed straight coupled transmission line (SCTL) cell that made it possible to generate standardized TEM waves at up to 220 MHz. The SCTL cell, modeled via the Newton-Raphson method combined with the method of moments, exhibits high field uniformity within a space of 25×25×25 (cm3). Various operating characteristics were studied by measuring the electric and magnetic field characteristics of the SCTL cell with dominant E-mode and dominant H-mode relative to frequency, power, and position in a 3-dimensional coordinate system. Resonant frequencies were measured for different E/H-field distributions of the SCTL cell, and the results were consistent with the numerical analysis. This new SCTL cell could be used in electromagnetic susceptibility (EMS) assessments of near E/H-fields, as well as in interference measurements.
Keywords :
Newton-Raphson method; TEM cells; electric field measurement; frequency measurement; interference; magnetic field measurement; numerical analysis; 3-dimensional coordinate system; Newton-Raphson method; dominant E-mode; dominant H-mode; electric field characteristics; electromagnetic susceptibility assessment; interference measurement; magnetic field characteristics; method of moment; numerical analysis; resonant frequency measurement; standardized TEM waves; straight coupled transmission line cell; Electric fields; Frequency measurement; Magnetic field measurement; Magnetic fields; Resonant frequency; Transmission line measurements; dominant E/H field; near field; straight coupled transmission line cell;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4577-2034-5