DocumentCode
1613995
Title
Adaptive circuits for the 0.5-V nanoscale CMOS era
Author
Itoh, Kiyoo
Author_Institution
Hitachi, Tokyo
fYear
2009
Firstpage
14
Lastpage
20
Abstract
The Vmins of logic, SRAM, and DRAM blocks were compared with a newly proposed methodology for evaluating Vmin based on speed variations, taking repair techniques into account. State-of-the-art 6T SRAM cells were then discussed in terms of Vmin and cell size. After that, many adaptive circuits and relevant technologies needed to break the 1V wall were proposed and evaluated, while taking the interconnect problem into account. Finally, 0.5 V nanoscale LSIs including mixed signal LSIs were predicted to be feasible, if relevant devices and fabrication processes are developed.
Keywords
CMOS logic circuits; CMOS memory circuits; DRAM chips; SRAM chips; large scale integration; mixed analogue-digital integrated circuits; nanoelectronics; DRAM block; SRAM cell; adaptive circuits; fabrication process; interconnect problem; logic circuits; mixed signal LSI; nanoscale CMOS; voltage 0.5 V; CMOS logic circuits; Degradation; Delay; Large scale integration; Logic devices; Logic gates; MOSFETs; Power supplies; Random access memory; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4244-3458-9
Type
conf
DOI
10.1109/ISSCC.2009.4977291
Filename
4977291
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