• DocumentCode
    1613995
  • Title

    Adaptive circuits for the 0.5-V nanoscale CMOS era

  • Author

    Itoh, Kiyoo

  • Author_Institution
    Hitachi, Tokyo
  • fYear
    2009
  • Firstpage
    14
  • Lastpage
    20
  • Abstract
    The Vmins of logic, SRAM, and DRAM blocks were compared with a newly proposed methodology for evaluating Vmin based on speed variations, taking repair techniques into account. State-of-the-art 6T SRAM cells were then discussed in terms of Vmin and cell size. After that, many adaptive circuits and relevant technologies needed to break the 1V wall were proposed and evaluated, while taking the interconnect problem into account. Finally, 0.5 V nanoscale LSIs including mixed signal LSIs were predicted to be feasible, if relevant devices and fabrication processes are developed.
  • Keywords
    CMOS logic circuits; CMOS memory circuits; DRAM chips; SRAM chips; large scale integration; mixed analogue-digital integrated circuits; nanoelectronics; DRAM block; SRAM cell; adaptive circuits; fabrication process; interconnect problem; logic circuits; mixed signal LSI; nanoscale CMOS; voltage 0.5 V; CMOS logic circuits; Degradation; Delay; Large scale integration; Logic devices; Logic gates; MOSFETs; Power supplies; Random access memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-3458-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2009.4977291
  • Filename
    4977291