Title :
An interactive sequential test pattern generation system
Author :
Razdan, Rahul ; Anwaruddin, M. ; Kovijanic, P.G. ; Ganesh, R. ; Shih, H.-C.
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
Abstract :
The authors present ITPG (Interactive Test Pattern Generator), an automatic test pattern generation tool which produces high fault coverage for complex sequential circuits. The tool is more successful than previous attempts at sequential test generation because of the innovative heuristics and high-level sequential primitives used in the system. Old heuristics, such as controllability and observability, have been extended to the sequential world, and a new heuristic, grouping, has been added to accelerate sequential test pattern generation. In addition, the tool allows the designer to influence the test generation process, thus resulting in the `interactive´ nature of the tool. Results from real industrial VLSI circuits show the effectiveness of this tool
Keywords :
VLSI; automatic testing; electronic engineering computing; integrated logic circuits; interactive systems; logic CAD; logic testing; sequential circuits; automatic test pattern generation tool; automatic testing; complex sequential circuits; controllability; effectiveness; fault coverage; grouping; heuristics; high-level sequential primitives; interactive sequential test pattern generation; logic CAD; logic testing; observability; real industrial VLSI circuits; Automatic test pattern generation; Circuit faults; Circuit testing; Controllability; Life estimation; Observability; Sequential analysis; Sequential circuits; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82275
