Title :
Thermal investigation of the three types of NTC thermistors
Author :
Pogorzelska, J. ; Maciak, J. ; Butkiewicz, B.S.
Author_Institution :
Inst. of Micro & Optoelectronics, Warsaw Univ. of Technol., Poland
fDate :
6/24/1905 12:00:00 AM
Abstract :
The peculiarities of electrical resistance variations for three types of negative temperature coefficient (NTC) thermistors, produced by different manufacturers I under the influences of long-term and short-term high-temperature tests are presented. The work is a continuation of earlier investigations [see Microelectronics Reliability, 2001, vol. 41, pp. 773-777]. NTC thermistors produced by SRC "Carat", Ukraine are compared with thermistors produced by Tewa-Termico, Poland, and Siemens.
Keywords :
electric resistance; semiconductor device testing; thermal analysis; thermistors; NTC thermistors; SRC "Carat"; Siemens; Tewa-Termico; electrical resistance variations; high-temperature tests; long-term tests; short-term tests; thermal investigation; Ceramics; Degradation; Electric resistance; Electrical resistance measurement; Manufacturing; Temperature sensors; Testing; Thermal resistance; Thermal stresses; Thermistors;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003214
