Title :
Aging of copper-nickel-cobalt manganite NTC thermistors [Cu0.1Ni0.8Co0.2Mn1.9O4]
Author :
Mrooz, O. ; Hadzarnan, I. ; Vakiv, M. ; Shpotyuk, O. ; Plewa, J. ; Altenburg, H. ; Uphoff, H.
Author_Institution :
Sci. Res. Co. "Carat", Lviv, Ukraine
fDate :
6/24/1905 12:00:00 AM
Abstract :
Aging phenomenon in copper-nickel-cobalt manganite NTC thermistors under thermal stresses at 125 and 170°C during 1000 h was studied. The relative resistance drift observed in NTC thermistors is correlated with the results of Cu0.1Ni0.8Co0.2Mn1.9O4 ceramic microstructures characterization (obtained by optical microscopy, SEM, electron probe and EDX microanalyses) and thermogravimetric analysis.
Keywords :
X-ray chemical analysis; ageing; ceramics; cobalt compounds; copper compounds; nickel compounds; optical microscopy; scanning electron microscopy; semiconductor materials; thermal analysis; thermal stresses; thermistors; 1000 h; 125 degC; 170 degC; Cu0.1Ni0.8Co0.2Mn1.9O4; EDX microanalyses; NTC thermistors; SEM; aging; ceramic microstructures characterization; electron probe; optical microscopy; relative resistance drift; thermal stresses; thermogravimetric analysis; Aging; Ceramics; Copper; Electron optics; Microstructure; Optical microscopy; Scanning electron microscopy; Thermal resistance; Thermal stresses; Thermistors;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003215
