• DocumentCode
    1614721
  • Title

    Aging of copper-nickel-cobalt manganite NTC thermistors [Cu0.1Ni0.8Co0.2Mn1.9O4]

  • Author

    Mrooz, O. ; Hadzarnan, I. ; Vakiv, M. ; Shpotyuk, O. ; Plewa, J. ; Altenburg, H. ; Uphoff, H.

  • Author_Institution
    Sci. Res. Co. "Carat", Lviv, Ukraine
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    375
  • Abstract
    Aging phenomenon in copper-nickel-cobalt manganite NTC thermistors under thermal stresses at 125 and 170°C during 1000 h was studied. The relative resistance drift observed in NTC thermistors is correlated with the results of Cu0.1Ni0.8Co0.2Mn1.9O4 ceramic microstructures characterization (obtained by optical microscopy, SEM, electron probe and EDX microanalyses) and thermogravimetric analysis.
  • Keywords
    X-ray chemical analysis; ageing; ceramics; cobalt compounds; copper compounds; nickel compounds; optical microscopy; scanning electron microscopy; semiconductor materials; thermal analysis; thermal stresses; thermistors; 1000 h; 125 degC; 170 degC; Cu0.1Ni0.8Co0.2Mn1.9O4; EDX microanalyses; NTC thermistors; SEM; aging; ceramic microstructures characterization; electron probe; optical microscopy; relative resistance drift; thermal stresses; thermogravimetric analysis; Aging; Ceramics; Copper; Electron optics; Microstructure; Optical microscopy; Scanning electron microscopy; Thermal resistance; Thermal stresses; Thermistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2002. MIEL 2002. 23rd International Conference on
  • Print_ISBN
    0-7803-7235-2
  • Type

    conf

  • DOI
    10.1109/MIEL.2002.1003215
  • Filename
    1003215
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1614721