Title :
The analysis of “yes” and “no” response by visual evoked stimulations in human EEG
Author :
Yingzhi Wang ; Guozhong Liu
Author_Institution :
Sch. of Instrum. Sci. & Opto-Electron. Eng., Beijing Inf. Sci. & Technol. Univ., Beijing, China
Abstract :
Many diseases can damage the brain, which make brain unable to communicate normally with the outside world through the peripheral nervous system. As an emerging technology, brain-computer interface(BCI) can convert electroencephalogram(EEG) to the control signal to try repairing function for patients. So the study of BCI can improve the life quality of the patients with severe neuromuscular damage. This paper introduces the EEG data acquisition system capable of detecting the visual evoked EEG of an answer to “yes/no” question. EEG signal processing includes preprocessing, common spatial pattern (CSP)-based feature extraction algorithm and support vector machine (SVM)-based feature classification method. Finally classification accuracy can achieves 81% in the experimental data of healthy subjects. The experimental results show that the EEG analysis method makes the patients with neuromuscular system damage simply communicate with external world, and provides the basis for study of further BCI.
Keywords :
brain-computer interfaces; electroencephalography; feature extraction; medical signal processing; signal classification; signal detection; support vector machines; BCI; CSP-based feature extraction algorithm; EEG data acquisition system; EEG signal processing; SVM-based feature classification; brain-computer interface; classification accuracy; common spatial pattern; control signal; electroencephalogram; human EEG; neuromuscular damage; no response; patient life quality; preprocessing; support vector machine; visual evoked stimulations; yes response; Accuracy; Band-pass filters; Classification algorithms; Electroencephalography; Feature extraction; Support vector machines; Visualization; EEG; common spatial pattern(CSP); support vector machine(SVM); visual evoked;
Conference_Titel :
Chinese Automation Congress (CAC), 2013
Conference_Location :
Changsha
Print_ISBN :
978-1-4799-0332-0
DOI :
10.1109/CAC.2013.6775817