Title :
Systematic, non-defect, yield and performance optimization on 90, 65 & 45nm microprocessors
Author :
Poindexter, Daniel ; Walsh, Brian ; Clougherty, Frances ; Tetzloff, Jon ; Thomas, David ; Rizzolo, Richard ; Salem, Gerard ; Crafts, James ; Nelson, Erik
Author_Institution :
IBM Syst. & Technol. Group, Hopewell Junction, NY, USA
Abstract :
Key elements of systematic yield optimization used for SOI 90, 65 & 45nm microprocessors performing between 1.5 - 5 GHz (Table 1) will be reviewed. A method for isolating, measuring and acting upon systematic yield elements is shown. Models for optimizing performance limited yield and optimizing FET performance for maximum yield are reviewed. Finally, techniques for ship product quality level yield optimization are shown.
Keywords :
circuit optimisation; field effect transistors; microprocessor chips; performance evaluation; FET performance; frequency 1.5 GHz to 5 GHz; microprocessor; performance optimization; ship product quality level yield optimization; size 45 nm; size 65 nm; size 90 nm; systematic yield element; systematic yield optimization; Delay; FETs; Logic gates; Microprocessors; Random access memory; Ring oscillators; Systematics;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2010 IEEE/SEMI
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6517-0
DOI :
10.1109/ASMC.2010.5551429
