Title :
A diagram technique for nonequilibrium processes in semiconductor microstructures
Author_Institution :
Dept. of Microelectron., Moscow Eng. Phys. Inst., Russia
fDate :
6/24/1905 12:00:00 AM
Abstract :
The development of submicron semiconductor devices demands a clear and general description of nonequilibrium phenomena in micro structures. To describe electronic transport in these new submicron structures, in many cases we cannot resort to a classical Boltzmann description but must include the quantum-mechanical aspects of electronic transport. In the time-reversible Schroedinger equation for an electron state, the state does not change its eigenenergy during its temporal evolution. Accordingly, this is a pure state description, which cannot treat electron-phonon and electron-electron interaction. Due to the statistical nature of kinetic processes, a definite conserved Hamiltonian for the Schroedinger equation cannot be specified and quantum device should be considered as a statistical system, characterized by the density matrix or Green´s function. The objective of this work is to develop such based on general principles of gauge invariance.
Keywords :
Green´s function methods; Schrodinger equation; electron-electron interactions; electron-phonon interactions; kinetic theory; matrix algebra; quantum interference phenomena; semiconductors; transport processes; Green´s function; classical Boltzmann description; density matrix; diagram technique; eigenenergy; electron state; electron-electron interaction; electron-phonon interaction; electronic transport; gauge invariance; nonequilibrium phenomena; nonequilibrium processes; pure state description; quantum kinetic equation; quantum-mechanical electronic transport aspects; semiconductor devices; semiconductor microstructures; statistical kinetic process nature; statistical system; time-reversible Schroedinger equation; Charge carrier processes; Electrons; Equations; Green´s function methods; Impurities; Kinetic theory; Microstructure; Phonons; Quantum mechanics; Semiconductor devices;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003225