Title :
Investigating Intensities of Very High Voltage Rise dv/dt Pulsed Power Source in Atmospheric Microplasma
Author :
Khadijah, Siti ; Akitsu, Tetsuya ; Otagawa, Tomohiro ; Yamazaki, Shinsuke ; Sakurai, Takeki
Author_Institution :
Univ. of Yamanashi Kofu, Yamanashi
Abstract :
Summary form only given. Fast rising voltage excites plasma discharges applied to light emitter and reactive treatment. Fast-rising voltage pulse, maximum rise up voltage as high as 436 MV/s, was generated by a compact pulse power generator. The micro-discharge apparatus consists of a bottom electrode made of a stainless steel sheet with 17 x 24 mm and an upper barrier coated by transparent conducting indium tin oxide film (ITO), and gap width (600 -1050 micro-m) filled with air at normal atmospheric pressure. Micro barrier discharge was excited in air. Sequences of images were recorded at micro-second to several hundred nano-seconds. The intensity distributions were calculated statistically. In this preliminary research, experiment was conducted in high voltage pulse at 2 kHz was supplied from pulse-power generator. Images taken at 100 ns, an area of 120 x 130 pixels of in tensity was determined by using Sobel edge enhancement method. Evolution of the intensity of each pixel were measured and investigated during voltage rise at varied voltage (6-7 kV).
Keywords :
discharges (electric); plasma diagnostics; plasma sources; pulsed power supplies; ITO; Sobel edge enhancement; atmospheric microplasma; bottom electrode; fast-rising voltage pulse; frequency 2 kHz; gap width; light emitter; micro terrier discharge; micro-discharge apparatus; plasma discharges; pulse-power generator; size 600 mum to 1050 mum; stainless steel sheet; transparent conducting indium tin oxide film; very high voltage rise pulsed power source; voltage 6 kV to 7 kV; Conductive films; Electrodes; Fault location; Indium tin oxide; Light emitting diodes; Plasma sources; Power generation; Pulse generation; Steel; Voltage;
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0915-0
DOI :
10.1109/PPPS.2007.4345521