• DocumentCode
    1615442
  • Title

    A Delay Measurement Mechanism for Asynchronous Circuits of Bundled-Data Model

  • Author

    Sato, Shuichi ; Ohtake, Satoshi

  • Author_Institution
    Grad. Sch. of Eng., Oita Univ., Oita, Japan
  • fYear
    2015
  • Firstpage
    243
  • Lastpage
    248
  • Abstract
    In this paper, we propose a delay measurement mechanism for asynchronous circuits of bundled-data model. In the proposed method, a time to digital converter (TDC) is used as a mechanism to measure the delay of a combinational block. Specifically, the critical paths of the combinational block are sought and their outputs are connected to the TDC to measure the delay of the block. Transitions which will be measured by the TDC are propagated through the paths using path delay tests for the paths. To evaluate the effectiveness of the proposed method, for a sample circuit, the delay margin of the circuit is evaluated by the TDC using logic simulation with timing information.
  • Keywords
    asynchronous circuits; combinational circuits; logic simulation; time-digital conversion; asynchronous circuits; bundled-data model; combinational block; delay measurement mechanism; logic simulation; path delay test; sample circuit; time to digital converter; timing information; Asynchronous circuits; Clocks; Combinational circuits; Delays; Integrated circuit modeling; Synchronization; Delay measurement; asynchronous circuits; bundled-data model; delay testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
  • Conference_Location
    Belgrade
  • Print_ISBN
    978-1-4799-6779-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2015.55
  • Filename
    7195704