Title :
A Delay Measurement Mechanism for Asynchronous Circuits of Bundled-Data Model
Author :
Sato, Shuichi ; Ohtake, Satoshi
Author_Institution :
Grad. Sch. of Eng., Oita Univ., Oita, Japan
Abstract :
In this paper, we propose a delay measurement mechanism for asynchronous circuits of bundled-data model. In the proposed method, a time to digital converter (TDC) is used as a mechanism to measure the delay of a combinational block. Specifically, the critical paths of the combinational block are sought and their outputs are connected to the TDC to measure the delay of the block. Transitions which will be measured by the TDC are propagated through the paths using path delay tests for the paths. To evaluate the effectiveness of the proposed method, for a sample circuit, the delay margin of the circuit is evaluated by the TDC using logic simulation with timing information.
Keywords :
asynchronous circuits; combinational circuits; logic simulation; time-digital conversion; asynchronous circuits; bundled-data model; combinational block; delay measurement mechanism; logic simulation; path delay test; sample circuit; time to digital converter; timing information; Asynchronous circuits; Clocks; Combinational circuits; Delays; Integrated circuit modeling; Synchronization; Delay measurement; asynchronous circuits; bundled-data model; delay testing;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-6779-7
DOI :
10.1109/DDECS.2015.55