• DocumentCode
    1615588
  • Title

    Increasing Manufacturing Yield Using Partially Programmable Circuits with CLB Implementation of Incompletely Specified Boolean Function of the Corresponding Sub-Circuit

  • Author

    Matrosova, A. ; Ostanin, S. ; Kirienko, I.

  • Author_Institution
    Tomsk State Univ., Tomsk, Russia
  • fYear
    2015
  • Firstpage
    267
  • Lastpage
    270
  • Abstract
    The new approach to partially programmable circuit design that allows masking arbitrary gate faults of a logical circuit is considered. It is supposed that only one gate may be fault. There are reserved Configurable Logic Blocks (CLBs) based on Look Up Tables (LUTs) that may mask a gate fault. The suggested approach in comparison with the currently in use ones allows masking any gate fault but not the certain stuck at faults at the gate poles.
  • Keywords
    Boolean functions; logic design; logic testing; programmable circuits; table lookup; CLB implementation; LUT; arbitrary gate fault masking; configurable logic blocks; gate poles; incompletely-specified Boolean function; logical circuit; look up tables; manufacturing yield improvement; partially-programmable circuit design; stuck-at faults; Boolean functions; Circuit faults; Combinational circuits; Data structures; Logic gates; Multiplexing; Programmable circuits; incompletely specified Boolean functions; partially programmable circuit; stuck-at faults; test patterns;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
  • Conference_Location
    Belgrade
  • Print_ISBN
    978-1-4799-6779-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2015.64
  • Filename
    7195709