DocumentCode
1615588
Title
Increasing Manufacturing Yield Using Partially Programmable Circuits with CLB Implementation of Incompletely Specified Boolean Function of the Corresponding Sub-Circuit
Author
Matrosova, A. ; Ostanin, S. ; Kirienko, I.
Author_Institution
Tomsk State Univ., Tomsk, Russia
fYear
2015
Firstpage
267
Lastpage
270
Abstract
The new approach to partially programmable circuit design that allows masking arbitrary gate faults of a logical circuit is considered. It is supposed that only one gate may be fault. There are reserved Configurable Logic Blocks (CLBs) based on Look Up Tables (LUTs) that may mask a gate fault. The suggested approach in comparison with the currently in use ones allows masking any gate fault but not the certain stuck at faults at the gate poles.
Keywords
Boolean functions; logic design; logic testing; programmable circuits; table lookup; CLB implementation; LUT; arbitrary gate fault masking; configurable logic blocks; gate poles; incompletely-specified Boolean function; logical circuit; look up tables; manufacturing yield improvement; partially-programmable circuit design; stuck-at faults; Boolean functions; Circuit faults; Combinational circuits; Data structures; Logic gates; Multiplexing; Programmable circuits; incompletely specified Boolean functions; partially programmable circuit; stuck-at faults; test patterns;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
Conference_Location
Belgrade
Print_ISBN
978-1-4799-6779-7
Type
conf
DOI
10.1109/DDECS.2015.64
Filename
7195709
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