DocumentCode :
1615733
Title :
Pressure-induced metallization phase transitions of PbSe and PbTe by electrical conductivity measurements and first principle methods
Author :
Yue Wang ; Chunjie Wang
Author_Institution :
Coll. of New Energy, Bohai Univ., Jinzhou, China
fYear :
2013
Firstpage :
870
Lastpage :
875
Abstract :
In situ electric conductivity measurements of PbSe and PbTe have been performed under high pressure in a diamond anvil cell. The results reveal the change of electron transport behaviors. As the pressure increased from ambient to 27 GPa, two and three abnormal conductivity changes were observed at room temperature in PbSe and PbTe, respectively. The abnormal conductivity changes in PbSe and PbTe can be ascribed to the structure phase transition. At high pressure, the conductivities in both PbSe and PbTe rise obviously and their values are near metal order. The first-principles calculations performed by CASTEP code based on the density functional theory illustrate that the direct band gap of PbTe vanishes at 15 GPa, which results in semiconductor to metal in PbTe. The results fully convinced that PbSe and PbTe can be metalized under pressure.
Keywords :
IV-VI semiconductors; ab initio calculations; amorphous semiconductors; density functional theory; energy gap; high-pressure solid-state phase transformations; lead compounds; metal-insulator transition; metallisation; CASTEP code; PbSe; PbTe; density functional theory; diamond anvil cell; direct band gap; electron transport behavior; first principle calculation; high-pressure structural phase transition; in situ electrical conductivity; lead chalcogenides; pressure 15 GPa; pressure-induced metallization phase transitionsz; semiconductor-metal transition; temperature 293 K to 298 K; Conductivity; Electric variables measurement; Lead; Photonic band gap; Pressure measurement; Semiconductor device measurement; conductivity; first principles; high pressure; metallization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Chinese Automation Congress (CAC), 2013
Conference_Location :
Changsha
Print_ISBN :
978-1-4799-0332-0
Type :
conf
DOI :
10.1109/CAC.2013.6775855
Filename :
6775855
Link To Document :
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