Title :
CAE functionality for verification of diagnostic programs
Author :
Pyron, Carol ; Sallade, Rex
Author_Institution :
Texas Instrum. Inc., Plano, TX, USA
Abstract :
A feasibility study that has identified computer-aided engineering (CAE) features and a methodology approach that will support BIT (built-in-test) verification through fault simulation are described. With an example, the authors illustrate the evolutionary fault simulation features and the attendant methodology to support BIT verification by simulation. The simulator functionality and methodology will support the complex simulation of an embedded BIT program. These enhancements can also be effective in verification of ATE (automatic test equipment) functional tests for higher density integrated circuits and boards
Keywords :
CAD/CAM; automatic test equipment; automatic testing; digital simulation; electronic engineering computing; fault location; integrated circuit testing; printed circuit testing; ATE; BIT verification; CAE; CAE functionality; IC testing; PCB testing; automatic test equipment; built-in-test; computer-aided engineering; embedded BIT program; fault simulation; feasibility study; functional tests; verification of diagnostic programs; Automatic test equipment; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer aided engineering; Computer simulation; Fault diagnosis; Integrated circuit testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82282
