IGBT ghost failures in boost topology circuits explained through third quadrant operation

Author

Craig, Alexander H. ; Randall, Ronald H. ; Yedinak, Joe

Author_Institution

Intersil Corp., Mountaintop, PA, USA

Volume

2

fYear

2000

fDate

6/22/1905 12:00:00 AM

Firstpage

1103

Abstract

Faster IGBTs are being applied increasingly in boost topology circuits such as the boost power factor correction (PFC) and flyback power converter circuits. Unfortunately, field application of IGBTs in these circuits has resulted in unexplained IGBT failures. These random failures may result from IGBT third-quadrant reverse-avalanche operation. Analysis has confirmed that many continuous current mode (CCM) circuits operate in this mode transiently. The effects of this operation may have a cumulative destructive effect on the IGBT. This effect and the physical causes of the failures are explained through circuit simulation, experimentation and scanning electron microscope (SEM) analysis. Circuit designer guidance is provided

Keywords

AC-DC power convertors; failure analysis; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; rectifying circuits; semiconductor device measurement; semiconductor device models; semiconductor device reliability; semiconductor device testing; switching circuits; AC/DC power conversion; IGBT ghost failures; boost power factor correction; boost topology circuits; circuit simulation; continuous current mode circuits; cumulative destructive effect; flyback power converter; power IGBTs; reverse-avalanche operation; scanning electron microscope analysis; third quadrant operation; Capacitance; Circuit topology; Diodes; Failure analysis; Inductors; Insulated gate bipolar transistors; Scanning electron microscopy; Switched-mode power supply; Switches; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Power Electronics Conference and Exposition, 2000. APEC 2000. Fifteenth Annual IEEE

Conference_Location

New Orleans, LA

Print_ISBN

0-7803-5864-3

Type

conf

DOI

10.1109/APEC.2000.822825

Filename

822825