DocumentCode :
1616041
Title :
Developing a decision support system for optimizing automated wafer fabrication
Author :
Pillai, Devadas
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
1988
Firstpage :
170
Lastpage :
176
Abstract :
A decision support system (DSS) was developed to help managers and engineers in the Factory Automation Group of Intel Corporation select the most appropriate solutions to strategic and operational problems that are encountered when trying to automate wafer-fabrication processes. The primary objective of the DSS was to help identify, and select from among the many alternatives, only those options that provide the highest manufacturing improvements and cost effectiveness for fab automation. For the development of the DSS, a project team was drawn from various disciplines of design, manufacturing, automation, and finance in Intel. The DSS resulted in first identifying critical issues that influenced manufacturing. A sensitivity analysis was then performed on the influencing factors, and the variations in results were interpreted. The results were then evaluated using risk analysis and value engineering principles, which caused some alternatives to be discarded. The team then recommended manufacturing planes based only on those viable alternatives.<>
Keywords :
decision support systems; factory automation; integrated circuit manufacture; management; DSS; Factory Automation Group; Intel; cost effectiveness; decision support system; fab automation; highest manufacturing improvements; identifying critical issues; manufacturing planes; operational problems; optimizing automated wafer fabrication; primary objective; risk analysis; sensitivity analysis; strategic problems; value engineering; viable alternatives; Automatic control; Costs; Decision support systems; Design automation; Engineering management; Fabrication; Manufacturing automation; Materials handling; Production facilities; Risk analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1988, Design-to-Manufacturing Transfer Cycle. Fifth IEEE/CHMT International
Conference_Location :
Lake Buena Vista, FL, USA
Type :
conf
DOI :
10.1109/EMTS.1988.16170
Filename :
16170
Link To Document :
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