DocumentCode :
1616162
Title :
Contamination Control Strategy based on Particle Flow Behavior near Fast Moving Devices in Flat Panel Display Fabrication Cleanroom
Author :
Chio, Hyunsik ; Cho, Hyuntae ; Kim, Giljun ; Kim, Haeryung ; Seo, Manseung
Author_Institution :
Dept. of Robot Syst. Eng., Tongmyong Univ., Busan
fYear :
2006
Firstpage :
652
Lastpage :
657
Abstract :
In flat panel display (FPD) fields, the defect rate of the final products yields the rate of particle deposition on FPD panels. Every best endeavor has been made to maintain a clean fabrication environment. However, contamination by airborne particles is still significant. Moreover, contamination by particles near fast moving devices such as a lift or loader has been reported as being serious. Existing well-known treatments for contamination control never worked near fast moving devices. Thus, at this stage, devising a new contamination control strategy based on the analysis of particle flow behavior upon device movement is inevitable to increase FPD productivity. In this study, the particle flow behavior near a fast moving lift is analyzed based upon the results of two and three dimensional transient flow simulations. The simulation results show consistency, insisting that the proposed approach is proper and reliable. Based on our experience associated with FPD cleanrooms and equipment, a new contamination control strategy for the moving lift system in a FPD cleanroom is proposed
Keywords :
clean rooms; flat panel displays; flow simulation; lifting; physics computing; surface contamination; contamination control strategy; fabrication cleanroom; fast moving devices; flat panel display; moving lift system; particle flow behavior; transient flow simulations; Contamination; Control systems; Fabrication; Flat panel displays; Glass; Liquid crystal displays; Manufacturing; Plasma displays; Productivity; Protection; Contamination Control; Flat Panel Display Cleanroom; Flow Simulation; Lift System;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE-ICASE, 2006. International Joint Conference
Conference_Location :
Busan
Print_ISBN :
89-950038-4-7
Electronic_ISBN :
89-950038-5-5
Type :
conf
DOI :
10.1109/SICE.2006.315795
Filename :
4108911
Link To Document :
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