• DocumentCode
    1616176
  • Title

    Analysis of trapping parameters in surface layer of solid insulating materials

  • Author

    Zhang, G.J. ; Wang, X.R. ; Yan, Z.

  • Author_Institution
    Xi´´an Jiaotong Univ., China
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    In this paper, we have investigated the trapping parameters in the surface layer of two kinds of insulating materials. The final aim is to construct the relationship between the surface microstructure of an insulating material and its flashover phenomena
  • Keywords
    flashover; insulating materials; surface potential; surface structure; flashover phenomena; solid insulating materials; surface layer; surface microstructure; trapping parameters; Charge carrier processes; Electrodes; Electron traps; Flashover; Insulation; Optical surface waves; Solids; Surface charging; Surface discharges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
  • Conference_Location
    Eindhoven
  • Print_ISBN
    0-7803-6352-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2001.955604
  • Filename
    955604