DocumentCode :
1616176
Title :
Analysis of trapping parameters in surface layer of solid insulating materials
Author :
Zhang, G.J. ; Wang, X.R. ; Yan, Z.
Author_Institution :
Xi´´an Jiaotong Univ., China
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
236
Lastpage :
239
Abstract :
In this paper, we have investigated the trapping parameters in the surface layer of two kinds of insulating materials. The final aim is to construct the relationship between the surface microstructure of an insulating material and its flashover phenomena
Keywords :
flashover; insulating materials; surface potential; surface structure; flashover phenomena; solid insulating materials; surface layer; surface microstructure; trapping parameters; Charge carrier processes; Electrodes; Electron traps; Flashover; Insulation; Optical surface waves; Solids; Surface charging; Surface discharges; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
Conference_Location :
Eindhoven
Print_ISBN :
0-7803-6352-3
Type :
conf
DOI :
10.1109/ICSD.2001.955604
Filename :
955604
Link To Document :
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