Title :
A model for power-supply noise injection in long interconnects
Author :
Saint-Laurent, Martin ; Swaminathan, Madhavan
Author_Institution :
Intel Corp., Austin, TX, USA
Abstract :
For long interconnects, the power-supply noise injected through the repeaters can be more critical than crosstalk simply because there is no easy way to get rid of it. This paper rigorously analyzes the injection mechanism using a novel device model. A closed-form expression quantifying the interconnect delay variations caused by the noise is derived. For typical 130-nm interconnects, the model is shown to be very accurate.
Keywords :
integrated circuit interconnections; integrated circuit noise; nanotechnology; 130 nm; closed-form expression; crosstalk; injection mechanism analysis; interconnect delay variations; long interconnects; power-supply noise injection; repeaters; Closed-form solution; Crosstalk; Delay; Differential equations; Integrated circuit interconnections; Integrated circuit noise; Repeaters; Threshold voltage; Timing; Wires;
Conference_Titel :
Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International
Print_ISBN :
0-7803-8308-7
DOI :
10.1109/IITC.2004.1345709
