DocumentCode
1616544
Title
An approach to the synthesis of synchronizable finite state machines with partial scan
Author
Inoue, Tomoo ; Masuzawa, Toshimitsu ; Youra, Hiroshi ; Fujiwara, Hideo
Author_Institution
Nara Inst. of Sci. & Technol., Japan
fYear
1996
Firstpage
130
Lastpage
135
Abstract
Initialization of sequential circuits is one of time-consuming processes in test generation for sequential circuits, and hence synthesizing sequential circuits of which synchronizing sequences are short is an important approach to reducing the cost of test generation for the circuits. In this paper, we propose an approach to the synthesis of finite state machines (FSMs) with partial scan. We focus on repeating partial scan for synchronizing FSMs, and present an extended synchronizing sequence which consists of scan inputs and normal inputs, and which takes a circuit to a single specific state, regardless of the initial state. To synthesize synchronizable FSMs, we formulate a problem of minimizing extended synchronizing sequence length, and present a heuristic algorithm for the problem. We show the experimental results of the minimization of extended synchronizing sequence length on MCNC´91 benchmark FSMs. The experimental results show that the proposed heuristic algorithm can find a minimum-length extended synchronizing sequence for most of MCNC´91 benchmark FSMs, and the length of the extended synchronizing sequence is three or less for all the benchmark FSMs
Keywords
automatic testing; boundary scan testing; design for testability; fault diagnosis; finite state machines; logic CAD; logic testing; minimisation of switching nets; sequential circuits; state assignment; DFT; MCNC´91 benchmark FSM; extended synchronizing sequence; heuristic algorithm; minimization; minimum-length extended synchronizing sequence; normal inputs; partial scan; scan inputs; sequential circuits synthesis; state assignment; state encoding; state transition; synchronizable finite state machines; synthesis for testability; test generation; Automata; Benchmark testing; Circuit synthesis; Circuit testing; Design for testability; Hardware; Heuristic algorithms; Minimization; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location
Hsinchu
ISSN
1085-7735
Print_ISBN
0-8186-7478-4
Type
conf
DOI
10.1109/ATS.1996.555149
Filename
555149
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