DocumentCode :
1616558
Title :
Effect of bridging groups of precursors on modulus improvement in plasma co-polymerized low-k films
Author :
Kunimi, Nobutaka ; Kawahara, Jun ; Nakano, Akinori ; Kinoshita, Keizo ; Hayashi, Yoshihiro ; Komatsu, Masashi ; Seino, Yutaka ; Ichikawa, Rie ; Takasu, Yuko ; Kikkawa, Takamaro
Author_Institution :
MIRAI, Tsukuba, Japan
fYear :
2004
Firstpage :
139
Lastpage :
141
Abstract :
We have demonstrated that the mechanical strength of organic silica low-k films can be enhanced by introducing a reinforcement monomer in a matrix monomer under plasma excitation. The modulus improvement mechanism was investigated by analyzing the film structure. Pyrolysis gas chromatography / mass spectrometry (Py-GC/MS) revealed incorporation of a reinforcement monomer in the matrix through co-polymerization reactions. Compositional analysis of the films showed that the extent of reinforcement is associated with co-polymerization ratio or the monomer content in the film. It is also indicated that the modulus enhancement depends on the content of 3D aromatic bridge structure, which is affected by the chemical structure of the reinforcement monomers.
Keywords :
chemical structure; chromatography; dielectric thin films; mass spectroscopy; mechanical strength; polymer films; polymerisation; pyrolysis; 3D aromatic bridge structure; chemical structure; co-polymerization ratio; co-polymerized low-k films; film compositional analysis; film structure analysis; mass spectrometry; matrix monomer; mechanical strength; modulus improvement mechanism; monomer content; organic silica low-k films; plasma excitation; plasma low-k films; precursor bridging groups; pyrolysis gas chromatography; reinforcement monomer; Active matrix organic light emitting diodes; Chemical analysis; Chemical technology; Dielectric constant; Digital video broadcasting; Optical films; Performance analysis; Plasma chemistry; Plasma temperature; Semiconductor films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International
Print_ISBN :
0-7803-8308-7
Type :
conf
DOI :
10.1109/IITC.2004.1345719
Filename :
1345719
Link To Document :
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