High-resolution analog measurement on mixed signal LSI tester

Author

Akiyama, Kohei ; Nishimura, Hiroshi ; Anazawa, Kyoji ; Kishida, Akito ; Kasuga, Nobuyuki

Author_Institution

Yokogawa Hewlett-Packard, Tokyo, Japan

fYear

1989

Firstpage

124

Lastpage

128

Abstract

The authors describe the HP 9480, a mixed-signal LSI tester featuring LF source/measurement modules capable of measurements on the order of 100 dB for standard dynamic range, signal-to-noise ratio, or total harmonic distortion measurements. To realize this tester, background noise was minimized by using a unique power supply system and proper ground management, and several function modules were developed. The authors describe the noise reduction techniques and functional modules. Measurement examples are also given

Keywords

Hewlett Packard computers; automatic test equipment; electric distortion measurement; electric noise measurement; electronic equipment testing; large scale integration; modules; HP 9480; LF source/measurement modules; background noise; function modules; mixed signal LSI tester; noise reduction; signal-to-noise ratio; standard dynamic range; total harmonic distortion measurements; Background noise; Distortion measurement; Dynamic range; Energy management; Large scale integration; Measurement standards; Power supplies; Signal to noise ratio; System testing; Total harmonic distortion;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/TEST.1989.82286

Filename

82286