Title :
Monte-Carlo analysis of measurement uncertainties for on-wafer Short-Open-Load-Reciprocal calibrations
Author :
Huang Hui ; Liu Xinmeng ; Lv Xin
Author_Institution :
Sch. of Inf. & Electron., Beijing Inst. of Technol., Beijing, China
Abstract :
The Short-Open-Load-Reciprocal (SOLR) calibration algorithm is firstly introduced. The formulas of scattering parameters solved by values of calibration standards are derived. Then the Guide to the Expression of Uncertainty in Measurement (GUM) compliant Monte-Carlo method is used to evaluate on-wafer scattering parameters measurement uncertainties.
Keywords :
Monte Carlo methods; S-parameters; calibration; measurement uncertainty; network analysis; Monte-Carlo analysis; calibration standards; measurement uncertainties; measurement uncertainty; on-wafer short-open-load-reciprocal calibrations; scattering parameters; Calibration; Measurement uncertainty; Monte Carlo methods; Reflection; Scattering parameters; Standards; Uncertainty; Monte-Carlo; On-wafer; Scattering parameters; Uncertainties;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4577-2034-5
