Title :
Using SSDE for USB2.0 conformance co-verification
Author :
Omnès, Thierry J -F ; Postuma, Gerard ; Verhaegh, Jos ; Boonen, Marleen ; Gatherer, Nick
Author_Institution :
Chief Technol. Office - Design Technol. Group, Philips Semicond., Eindhoven, Netherlands
Abstract :
Keeping up with the increase in system design complexity requires the deployment of extensive engineering re-use technologies, so-called platform-based design techniques (Chang et al., 1999). When creating derivatives of such a complex systems-on-chip (SOC) platform, verification represents 70% of the overall cost. In this process, functional verification has become a huge obstacle. Engineers are assumed to know how to ensure conformance to an ambiguous specification by developing a million test vectors, which may represent only 50 milliseconds of real-time operation underlines Bob Payne, CTO Philips Semiconductors US (Scott et al., 2001). Moreover, software is playing an increasing if not dominant role especially in this platform derivative game, resulting in a burning need for a software and hardware functional co-verification solution at the integrated SOC level but also in the early intellectual property (IP) development cycles. In this paper we illustrate the use of SSDE for USB2.0 conformance co-verification.
Keywords :
conformance testing; formal verification; hardware-software codesign; system buses; system-on-chip; CTO Philips Semiconductors US; IP development; SOC platform; SSDE; USB2.0; conformance coverification; engineering reuse technology; functional verification; integrated SOC level; intellectual property; platform derivative; platform-based design; real-time operation; software-hardware coverification; specification conformance; system and software design environment; system design complexity; systems-on-chip; test vector; Costs; Design engineering; Field programmable gate arrays; Hardware; Semiconductor device testing; Silicon; Software debugging; Software design; Software performance; Software prototyping;
Conference_Titel :
Formal Methods and Models for Co-Design, 2003. MEMOCODE '03. Proceedings. First ACM and IEEE International Conference on
Conference_Location :
Mont Saint Michel, France
Print_ISBN :
0-7695-1923-7
DOI :
10.1109/MEMCOD.2003.1210096