• DocumentCode
    1616832
  • Title

    An analytical model of short channel MOSFET including velocity overshoot

  • Author

    Kasemsuwan, V.

  • Author_Institution
    Dept. of Electron., King Mongkut´´s Inst. of Technol., Bangkok, Thailand
  • Volume
    2
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    451
  • Abstract
    In this paper, an analytical model of short channel MOSFET including velocity overshoot is proposed. The model is developed based on the solution of energy balance equation under the assumption of displaced Maxwellian distribution. The resulting model is the augmented drift-diffusion velocity model. The parameters involved in the velocity model are physical parameters with only one fitting parameter. The model also includes the effects of the mobility degradation, drain induced barrier lowering effect, source drain series resistance and the channel length modulation. The theoretical predictions of the model are compared with the experimental data and shown to be in good agreement over a wide range of bias conditions.
  • Keywords
    MOSFET; carrier mobility; semiconductor device models; Maxwellian distribution; analytical model; augmented drift-diffusion velocity model; channel length modulation; drain induced barrier lowering; energy balance equation; fitting parameter; mobility degradation; short channel MOSFET; source drain series resistance; velocity overshoot; Analytical models; Degradation; Hydrodynamics; MOS devices; MOSFET circuits; Maxwell equations; Rain; Temperature; Thermoelectricity; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2002. MIEL 2002. 23rd International Conference on
  • Print_ISBN
    0-7803-7235-2
  • Type

    conf

  • DOI
    10.1109/MIEL.2002.1003296
  • Filename
    1003296