Title : 
NASDAC - A new simulation tool for the electro-thermal analysis of bipolar devices: application to multi-finger AlGaAs/GaAs HBT´s
         
        
            Author : 
Macchiaroli, M. ; Alessandro, V.D. ; Rinaldi, N.
         
        
            Author_Institution : 
Dept. of Electron. & Telecommun. Eng., Naples Univ., Italy
         
        
        
        
            fDate : 
6/24/1905 12:00:00 AM
         
        
        
            Abstract : 
In this paper a new simulation tool is presented, suitable to describe the electro-thermal behavior in multi-finger AlGaAs/GaAs devices. The program is based on a new analytical formulation to compute the device temperature distribution both for the steady-state and the transient case and incorporates an accurate electro-thermal physically-based model for the elementary transistor. The effect of the geometry of heat dissipating regions is accounted for. Thermal conductivity dependence on temperature and de-biasing effects across metallization layers are also included. Hence the simulator can be efficaciously used to enhance the thermal chip design, by means of illustrative comparisons between different structures.
         
        
            Keywords : 
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; temperature distribution; thermal analysis; thermal conductivity; AlGaAs-GaAs; NASDAC simulation tool; analytical model; bipolar device; electro-thermal analysis; heat dissipation; metallization layer; multi-finger AlGaAs/GaAs HBT; temperature distribution; thermal chip design; thermal conductivity; Analytical models; Computational modeling; Distributed computing; Gallium arsenide; Geometry; Physics computing; Steady-state; Temperature distribution; Thermal conductivity; Transient analysis;
         
        
        
        
            Conference_Titel : 
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
         
        
            Print_ISBN : 
0-7803-7235-2
         
        
        
            DOI : 
10.1109/MIEL.2002.1003297