DocumentCode :
161686
Title :
Strain response of monolayer MoS2 in the ballistic regime
Author :
Hung-Chih Chang ; Pin-Shiang Chen ; Fu-Liang Yang ; Liu, C.W.
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2014
fDate :
28-30 April 2014
Firstpage :
1
Lastpage :
2
Abstract :
Two-dimensional (2-D) materials are perfect channels for ultra thin body (UTB) device due to the perfect electrostatic control. Graphene is the most well-known 2-D material with high mobility but lack of bandgap. To overcome the shortage of graphene-based transistors, 2-D monolayer transition metal dichalcogenides (TMD) with intrinsic bandgap (1eV~2eV) have drawn much attention. MoS2 is expected to be one of the promising candidates among all TMD materials for the channels of UTB FETs [1][2]. Strain technology is in fact responsible for an alteration of the band structure in silicon to enhance the device performance [3]. With the appropriate strain engineering on the 2-D materials, the implementation to novel technology process of high performance transistor could be realized.
Keywords :
ballistic transport; field effect transistors; graphene; molybdenum compounds; monolayers; 2D materials; 2D monolayer transition metal dichalcogenides; MoS2; TMD materials; UTB FET channel; UTB device; ballistic regime; electrostatic control; graphene-based transistors; high performance transistor technology process; intrinsic bandgap; monolayer strain response; strain engineering; strain technology; two-dimensional materials; ultra thin body device; Current density; Effective mass; Materials; Photonic band gap; Tensile strain; Uniaxial strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems and Application (VLSI-TSA), Proceedings of Technical Program - 2014 International Symposium on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/VLSI-TSA.2014.6839672
Filename :
6839672
Link To Document :
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