DocumentCode :
1617036
Title :
Verification of transaction-level SystemC models using RTL testbenches
Author :
Jindal, Rohit ; Jain, Kshitiz
Author_Institution :
CRnD ST Microelectron., Noida, India
fYear :
2003
Firstpage :
199
Lastpage :
203
Abstract :
System architects working on SoC design have traditionally been hampered by the lack of a coherent methodology for architecture evaluation and co-verification of hardware and software. SystemC 2.0 facilitates the development of transaction-level models (TLMs), which are models of the hardware system components at higher level of abstraction than RTL. Due to lower modeling effort yet higher simulation speed, TLMs are useful for architectural exploration, algorithmic evaluation, hardware-software partitioning and software development. The problems posed by SOC design methodologies require development of models at higher abstraction also for the earlier developed IP´s. The development time of a TLM IP is already low, so if we can reduce the verification time by re-use of the earlier RTL test benches we can reduce the overall cost of such an IP TLM. This paper focuses on the methodology to use the RTL testbenches for verification of a SystemC model of the same IP at a higher abstraction level (transaction level), some tools available in the market to support this testbench reuse and the implementation challenges posed by the mentioned verification technique.
Keywords :
hardware-software codesign; program verification; system-on-chip; transaction processing; RTL testbench; SOC design; SoC design; SystemC 2.0; TLM IP; algorithmic evaluation; architectural exploration; architecture evaluation; hardware system component model; hardware-software coverification; hardware-software partitioning; high level abstraction; model verification; software development; system architecture; system-on-chip; transaction level; transaction-level SystemC model; Costs; Design engineering; Design methodology; Hardware; Microelectronics; Partitioning algorithms; Programming; Software algorithms; System testing; Yarn;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Formal Methods and Models for Co-Design, 2003. MEMOCODE '03. Proceedings. First ACM and IEEE International Conference on
Conference_Location :
Mont Saint Michel, France
Print_ISBN :
0-7695-1923-7
Type :
conf
DOI :
10.1109/MEMCOD.2003.1210104
Filename :
1210104
Link To Document :
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