Title :
Easily testable data path allocation using input/output registers
Author :
Huang, Li-Ren ; Jou, Jing-Yang ; Kuo, Sy-Yen ; Liao, Wen-Bin
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Most existing behavioral synthesis systems concentrate on area and performance optimization, while ignoring other design qualities such as testability. In this paper‡, we present three algorithms for register, module, and interconnection allocation of behavioral synthesis respectively to improve testability in data path allocation without assuming any specific test strategy. By using primary input/output registers effectively, the proposed algorithms produce RTL designs with better testability, while incur low or even no hardware overhead. Four benchmarks are synthesized using the proposed approaches and the results are compared with the best results of similar works in the literature. It shows that our approaches give both higher fault coverage and lower hardware overhead
Keywords :
VLSI; automatic testing; built-in self test; circuit optimisation; data flow graphs; design for testability; fault diagnosis; hardware description languages; high level synthesis; integrated circuit design; integrated circuit testing; logic partitioning; logic testing; shift registers; ATPG; DFT; RTL design; VLSI synthesis; algorithms; behavioral synthesis systems; benchmarks; higher fault coverage; improved testability; input/output registers; interconnection allocation; lower hardware overhead; module allocation; optimization; register allocation; testable data path allocation; Algorithm design and analysis; Benchmark testing; Circuit synthesis; Circuit testing; Design for testability; Hardware; Optimization; Registers; System testing; Very large scale integration;
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu
Print_ISBN :
0-8186-7478-4
DOI :
10.1109/ATS.1996.555151