DocumentCode
1617167
Title
A new working principle of ferroelectric gate FET memory with an additional electrode
Author
Khoa, Tran Dang ; Horita, Susumu
Author_Institution
Sch. of Mater. Sci., Japan Adv. Inst. of Sci. & Technol. (JAIST), Ishikawa, Japan
Volume
2
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
513
Lastpage
516
Abstract
Reported a new operating principle of ferroelectric gate FET memory. With an intermediate electrode inserted between a ferroelectric capacitor and a MIS-FET, the memory has potential to solve problems of short retention time, high operation voltage and instability performance of conventional ferroelectric gate FET memory. The memory was experimentally and theoretically investigated and was verified to be practicable
Keywords
MISFET; circuit stability; electrodes; ferroelectric capacitors; ferroelectric storage; MISFET; ferroelectric capacitor; ferroelectric gate FET memory; instability performance; intermediate electrode; operation voltage; retention time; Capacitors; Electrodes; FETs; Ferroelectric films; Ferroelectric materials; Nonvolatile memory; Polarization; Random access memory; Voltage; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Conference_Location
Nis
Print_ISBN
0-7803-7235-2
Type
conf
DOI
10.1109/MIEL.2002.1003309
Filename
1003309
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