Abstract :
The following topics are dealt with: electron devices; solid state circuit; bioelectronics; communication circuits; device reliability; digital circuits; MEMS; power electronics; nanoelectronics; analogue circuits; ESD; power devices; CMOS devices; photonics; memory technology; organic devices; sensors; microwave devices; and thin film transistors.
Keywords :
CMOS integrated circuits; analogue circuits; biomedical electronics; electrostatic discharge; micromechanical devices; microwave devices; nanoelectronics; power electronics; reliability; sensors; storage management chips; thin film transistors; CMOS devices; ESD; MEMS; analogue circuits; bioelectronic; communication circuits; device reliability; digital circuits; electron devices; memory technology; microwave devices; nanoelectronics; organic devices; photonics; power devices; power electronics; sensors; solid state circuit; thin film transistors;
Conference_Titel :
Electron Devices and Solid State Circuit (EDSSC), 2012 IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4673-5694-7
DOI :
10.1109/EDSSC.2012.6482758
