• DocumentCode
    1617276
  • Title

    Analysis of random common-mode rejection ratio in op-amps

  • Author

    Yu, Chong-Gun ; Geiger, Randall L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    1992
  • Firstpage
    949
  • Abstract
    One of the important nonideal factors causing op-amp errors is the common-mode rejection ratio (CMRR). The CMRR of CMOS op-amps and its statistical characteristics are thoroughly analyzed. The random and deterministic CMRR of a two-stage CMOS op-amp are derived. The statistical characteristics of the total CMRR are discussed. A definition of the CMRR for processes is given. A sample amplifier has been designed for high-speed and high-precision applications. The simulated performances of the op-amp are shown
  • Keywords
    CMOS integrated circuits; linear integrated circuits; operational amplifiers; CMOS; deterministic CMRR; high-precision applications; nonideal factors; op-amps; random common-mode rejection ratio; simulated performances; statistical characteristics; Circuit simulation; Computer errors; Degradation; Differential amplifiers; Error analysis; Laboratories; Operational amplifiers; Random variables; Semiconductor device modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0510-8
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1992.271141
  • Filename
    271141