DocumentCode
1617338
Title
A remotely operated power quality test platform based on a 120 kVA fully programmable three-phase source
Author
Matheson, Evelyn ; Von Jouanne, Annette ; Wallace, Alan
Author_Institution
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume
2
fYear
2001
Firstpage
1188
Abstract
This paper describes the development of an invaluable power quality tool through the application of a 120 kVA three-phase programmable AC power source with an integrated arbitrary waveform generator. Implementation details are presented including experimental results that demonstrate the flexibility of the source/arbitrary waveform generator to simulate common power quality disturbances such as voltage sags, swells, outages, harmonics, unbalance, and capacitor switching transients. Example test bed environments are developed and discussed allowing for the comprehensive power quality testing of loads such as adjustable speed drive systems, line-operated motors, and power supplies. Remote programming and control of the arbitrary waveform generator, including the development of an instrument driver library database, through LabVIEW is also discussed.
Keywords
automatic test equipment; automatic test software; capacitor switching; harmonic distortion; load (electric); power supply quality; power system faults; power system harmonics; switching transients; waveform generators; 120 kVA; ATE; LabVIEW; adjustable speed drive systems; arbitrary waveform generator; capacitor switching transients; fully programmable three-phase source; harmonics; line-operated motors; outages; power quality disturbances; power quality test platform; power supplies; programmable AC power source; unbalance; voltage sags; voltage swells; Capacitors; Databases; Instruments; Libraries; Power quality; Power supplies; Power system harmonics; Signal generators; System testing; Variable speed drives;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location
Chicago, IL, USA
ISSN
0197-2618
Print_ISBN
0-7803-7114-3
Type
conf
DOI
10.1109/IAS.2001.955645
Filename
955645
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