Test generation and fault detection techniques in mixed circuits

The authors have revised some of the existing test generation and fault detection methods in analog and mixed circuits. Also, they determined test vector generation or test stimuli and fault detection in mixed circuits based on a catastrophic fault model simulated at a transistor level. The transient current test is proposed to measure the transient response of the power supply current consumption of analog and digital blocks with stimuli that have previously been determined. These methods have been compared with the fault signature analysis that is obtained by the convolution product of the input signals and the response function to an impulse of the analog and linearized digital blocks to show the advantage of the transient current test. Examples where it is possible to check fault detection by application of the power supply current consumption methods are shown