Title :
Evaluation of epi layer resistivity effects in mixed-signal submicron CMOS integrated circuits
Author :
Liberali, Valentino
Author_Institution :
Dept. of Inf. Technol., Univ. of Milano, Crema, Italy
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper illustrates a simple model for calculation and experimental evaluation of epi layer resistance. The model can be used during early stages of mixed-signal integrated circuit design, to estimate the effects of switching noise injection from digital cells to analog circuitry. Moreover, the proposed model leads to a simplified equivalent circuit that can be used for fast SPICE-level simulations of crosstalk effects
Keywords :
CMOS integrated circuits; SPICE; circuit simulation; crosstalk; equivalent circuits; integrated circuit noise; mixed analogue-digital integrated circuits; SPICE-level simulations; crosstalk effects; epi layer resistivity effects; equivalent circuit; mixed-signal integrated circuits; submicron CMOS; switching noise injection; CMOS integrated circuits; CMOS technology; Conductivity; Crosstalk; Integrated circuit modeling; Integrated circuit noise; Semiconductor device modeling; Switching circuits; Testing; Voltage;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003321
