• DocumentCode
    1617550
  • Title

    Equivalent Scheme of a Detector Using the Hot Electron Effect

  • Author

    Bechasnov, Alexander M. ; Goikhman, Mikhail B. ; Golovkin, Ivan S. ; Kovalev, Nikolay F. ; Kolganov, Nikolay G. ; Palitsin, AlexeyV

  • Author_Institution
    Russian Acad. of Sci., Nizhny Novgorod
  • fYear
    2007
  • Firstpage
    308
  • Lastpage
    308
  • Abstract
    Summary form only given. Microwave solid-state detectors and mixers based on the hot electron effect are widely used in relativistic high frequency electronics as a convenient means of diagnostics. These devices are used for measuring short high power pulses for frequencies ranging from hundreds of megahertz to hundreds of gigahertz. They have wide dynamic range and, importantly, are not adversely affected by overloading. Sensitivity in such detectors is easily controlled within a wide range without recalibration. The present work proposes a simple equivalent scheme of a semiconducting probe, which allows us to realize a correct algorithm for analyzing basic processes of transformation of the spectrum of signals and their filtration, and also to tackle issues associated with embedding the detector in a circuit for measurement. Operating regimes of waveguide and coaxial detectors are studied using the suggested scheme. In particular, we analyze possible sources of measurement error due to high harmonics in the spectrum of received radiation and frequency-dependence of the detector´s electrodynamic system.
  • Keywords
    hot carriers; microwave detectors; semiconductor devices; sensors; coaxial detectors; electrodynamic system; filtration; hot electron effect; measurement error; semiconducting probe; waveguide detectors; Detectors; Dynamic range; Electrons; Frequency measurement; Microwave devices; Power measurement; Probes; Pulse measurements; Semiconductivity; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4345614
  • Filename
    4345614