DocumentCode :
1617550
Title :
Equivalent Scheme of a Detector Using the Hot Electron Effect
Author :
Bechasnov, Alexander M. ; Goikhman, Mikhail B. ; Golovkin, Ivan S. ; Kovalev, Nikolay F. ; Kolganov, Nikolay G. ; Palitsin, AlexeyV
Author_Institution :
Russian Acad. of Sci., Nizhny Novgorod
fYear :
2007
Firstpage :
308
Lastpage :
308
Abstract :
Summary form only given. Microwave solid-state detectors and mixers based on the hot electron effect are widely used in relativistic high frequency electronics as a convenient means of diagnostics. These devices are used for measuring short high power pulses for frequencies ranging from hundreds of megahertz to hundreds of gigahertz. They have wide dynamic range and, importantly, are not adversely affected by overloading. Sensitivity in such detectors is easily controlled within a wide range without recalibration. The present work proposes a simple equivalent scheme of a semiconducting probe, which allows us to realize a correct algorithm for analyzing basic processes of transformation of the spectrum of signals and their filtration, and also to tackle issues associated with embedding the detector in a circuit for measurement. Operating regimes of waveguide and coaxial detectors are studied using the suggested scheme. In particular, we analyze possible sources of measurement error due to high harmonics in the spectrum of received radiation and frequency-dependence of the detector´s electrodynamic system.
Keywords :
hot carriers; microwave detectors; semiconductor devices; sensors; coaxial detectors; electrodynamic system; filtration; hot electron effect; measurement error; semiconducting probe; waveguide detectors; Detectors; Dynamic range; Electrons; Frequency measurement; Microwave devices; Power measurement; Probes; Pulse measurements; Semiconductivity; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4345614
Filename :
4345614
Link To Document :
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