DocumentCode :
1617605
Title :
A novel decoupling capacitor for power integrity of quad flat nonlead (QFN) package
Author :
Guan, Sheng-Wei ; Kuo, Chih-Wen ; Wang, Chen-Chao
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
fYear :
2011
Firstpage :
1913
Lastpage :
1916
Abstract :
This paper describes the progressions for power and signal integrity issues on quad flat non-lead (QFN) package. A novel decoupling capacitor is achieved by modifying the footprint of QFN package. The modified footprint is connected to printed circuit board (PCB) power plane and coated the solder mask above. A large decoupling capacitor between power and ground is achieved by thin film solder mask and large size of die pad, which parallel to and decrease the input impedance of power delivery network (PDN) without parasitic effects at low frequency. After 2 GHz, adding more vias can decrease and shift the high impedance caused by equivalent inductance of via to high frequency. This novel decoupling capacitor is fully compatible with PCB process and significantly decreasing the high impedance of PDN.
Keywords :
capacitors; electronics packaging; printed circuits; soldering; thin films; PCB process; decoupling capacitor; equivalent inductance; frequency 2 GHz; power delivery network; power integrity; printed circuit board; quad flat nonlead package; thin film solder mask; Bandwidth; Capacitors; Impedance; Inductance; Joining processes; Lead; Packaging; QFN; decoupling capacitor; power integrity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4577-2034-5
Type :
conf
Filename :
6174150
Link To Document :
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