DocumentCode :
1617833
Title :
A 65nm CMOS comparator with modified latch to achieve 7GHz/1.3mW at 1.2V and 700MHz/47µW at 0.6V
Author :
Goll, Bernhard ; Zimmermann, Horst
Author_Institution :
Vienna Univ. of Technol., Vienna
fYear :
2009
Firstpage :
328
Abstract :
Clocked regenerative comparators, which use positive feedback of a latch to force a fast decision, are used for many applications. In a 10 GHz 3-stage comparator in 1.2 V 0.11 mum CMOS is presented and is designed to extract every 4th bit of a 40 Gb/s data stream. A BER<1012 for 1 Vpp at the input is achieved. Depending of the intended application, the constant tail current and the low-voltage swing of the CML blocks may or may not be beneficial. In a latch-type sense amplifier (in 1.5V 0.13 mum CMOS) for use in SRAMs is investigated. The delay time is 119 ps for an input voltage difference of 100 mV. A disadvantage is that for proper operation a sufficiently large supply voltage is needed due to the stack of transistors and therefore the comparison time is longer than 11 ns at 0.7 V In a comparator with similar circuit structure in 1.8 V 0.18 mum CMOS is described, consuming 350 muW at 1.4 GHz. The standard deviation of the offset without compensation is delta=31.6 mV. The sense-amplifier presented (1.2V 90nm CMOS, 225 muW @ 2GHz) also consists of a typical latch with two cross-coupled CMOS inverters. The comparator (1.5V 0.12 mum CMOS, low-threshold transistors) reaches a sensitivity (BER=10-9) of 16.5 mV @ 4 GHz/1.5 V and 25.8 mV @ 500 MHz/0.5 V. The design of the latch still needs static current and so 2.65 mW is needed at 6 GHz/1.5 V.
Keywords :
CMOS integrated circuits; MMIC amplifiers; SRAM chips; comparators (circuits); delays; error statistics; CMOS comparator; SRAM; bit rate 40 Gbit/s; clocked regenerative comparators; cross-coupled CMOS inverter; delay time; frequency 1.4 GHz; frequency 4 GHz; frequency 500 MHz; frequency 6 GHz; frequency 7 GHz; frequency 700 MHz; latch-type sense amplifier; low-voltage swing; power 1.3 mW; power 2.65 mW; power 350 muW; power 47 muW; size 0.11 mum; size 0.18 mum; size 65 nm; time 119 ps; transistor; voltage 0.5 V; voltage 0.6 V; voltage 0.7 V; voltage 1.2 V; voltage 1.5 V; voltage 1.8 V; voltage 100 mV; voltage 16.5 mV; voltage 25.8 mV; voltage 31.6 mV; Bit error rate; Circuits; Clocks; Delay effects; Inverters; Latches; Semiconductor device measurement; Time measurement; Variable structure systems; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-3458-9
Type :
conf
DOI :
10.1109/ISSCC.2009.4977441
Filename :
4977441
Link To Document :
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