Title :
A sub-1V bandgap voltage reference in 32nm FinFET technology
Author :
Annema, A.J. ; Veldhorst, P. ; Doornbos, G. ; Nauta, B.
Author_Institution :
Univ. of Twente, Enschede
Abstract :
The bulk CMOS technology is expected to scale down to about 32 nm node and likely the successor would be the FinFET. The FinFET is an ultra-thin body multi-gate MOS transistor with among other characteristics a much higher voltage gain compared to a conventional bulk MOS transistor. Bandgap reference circuits cannot be directly ported from bulk CMOS technologies to SOI FinFET technologies, because both conventional diodes cannot be realized in thin SOI layers and also, area-efficient resistors are not readily available in processes with only metal(lic) gates. In this paper, a sub-1 V bandgap reference circuit is implemented in a 32 nm SOI FinFET technology, with an architecture that significantly reduces the required total resistance value.
Keywords :
MOSFET; nanoelectronics; reference circuits; silicon-on-insulator; SOI FinFET technology; Si-JkJk; bandgap voltage reference circuits; bulk CMOS technology; size 32 nm; thin SOI layers; ultra-thin body multigate MOS transistor; CMOS process; CMOS technology; Circuits; Diodes; FinFETs; Immune system; MOSFETs; Photonic band gap; Resistors; Voltage;
Conference_Titel :
Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-3458-9
DOI :
10.1109/ISSCC.2009.4977443