DocumentCode :
1617947
Title :
Calibration and characterization of Chino 900 nm silicon narrow-band radiation thermometer
Author :
Sakuma, F. ; Ma, L. ; Suzuki, T. ; Kobayashi, T. ; Nakanishi, A.
Author_Institution :
Nat. Metrol. Inst. of Japan, AIST, Ibaraki, Japan
Volume :
1
fYear :
2004
Firstpage :
72
Abstract :
This paper describes the calibration and characterization of the Chino 900 nm standard radiation thermometer, IR-RST-90 W. The gain ratio, fixed-point calibrations, spectral responsivity, nonlinearity, size-of-source effect, distance effect, zero-offset stability and temperature drift were measured. Some problems were found for this thermometer regarding the out-of-band suppression, the size-of-source effect and the temperature drifts. A new type radiation thermometer was manufactured for improving the quality to use as a standard radiation thermometer.
Keywords :
blackbody radiation; calibration; temperature measurement; thermometers; Chino 900 nm silicon narrow-band radiation thermometer; IR-RST-90 W; fixed-point blackbody; fixed-point calibrations; spectral responsivity; temperature drifts;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE 2004 Annual Conference
Conference_Location :
Sapporo
Print_ISBN :
4-907764-22-7
Type :
conf
Filename :
1491370
Link To Document :
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