Title :
Modelling of bipolar DCS DOT circuits
Author :
Vida-Torku, E. Kofr ; Parise, Salvatore A. ; Gaede, Rhonda K.
Author_Institution :
IBM, Hopewell Junction, NY, USA
Abstract :
The authors present the results of studies that were performed on bipolar differential cascode switch (DCS) logic family fault models. A large number of process defects in DCS DOT circuits were not detected by the stuck fault models. A new approach to modeling DCS DOT circuits was developed to accurately represent process defects. Procedures are outlined to determine the best models for complex DCS DOT circuits. This modeling technique is based on the premise that the fault model must accurately represent the physical circuit. The new model guarantees detection of all process defects
Keywords :
bipolar integrated circuits; circuit analysis computing; fault location; integrated logic circuits; logic testing; bipolar DCS DOT circuits; differential cascode switch; logic family fault models; modeling; process defects; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Distributed control; Fault detection; Logic circuits; Logic functions; Switches; US Department of Transportation;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271173
