• DocumentCode
    1618019
  • Title

    Investigation of waffle structure SCR for electro-static discharge (ESD) protection

  • Author

    Qiang Cui ; Shurong Dong ; Yan Han

  • Author_Institution
    Dept. of ISEE, Zhejiang Univ., Hangzhou, China
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The waffle layout SCR-based ESD protection device is presented and analyzed in this paper. This waffle structure with symmetrical layout is designed to generate more current paths to distribute ESD currents better. TLP I-V measurement results show that, the stand-alone waffle layout SCR costs only 39 percent silicon area of conventional stripe layout SCR, but can achieve better ESD robustness. Results also show that the trigger voltage and current handling ability of waffle layout SCR can be adjustable to meet different operating demands by changing the device dimensions.
  • Keywords
    electrostatic discharge; thyristors; ESD protection device; TLP I-V measurement; electro-static discharge protection; symmetrical layout; waffle layout SCR; waffle structure; Cathodes; Current measurement; Electrostatic discharges; Layout; Thyristors; Trigger circuits; Voltage measurement; ESD Robustness; Electro-static discharge (ESD); Silicon-controlled rectifier (SCR); Symmetrical layout;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid State Circuit (EDSSC), 2012 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4673-5694-7
  • Type

    conf

  • DOI
    10.1109/EDSSC.2012.6482791
  • Filename
    6482791