Title :
MEMS tuneable dielectric resonator structures for microwave and millimetre wave applications
Author :
Klein, N. ; Panaitov, G. ; Daya, K.S.
Author_Institution :
Forschungszentrum Julich, Germany
Abstract :
In this contribution a novel approach for tuning of dielectric resonators by microelectromechanical switches (MEMS) is presented. This approach is based on intermodal coupling between the TE01δ mode of a cylindrical dielectric resonator and a planar resonator composed of a patterned metal film. The resonance frequency of the planar resonator can be changed either MEMS leading to a change of the intermodal coupling between the planar resonator mode and the TE01δ mode. As a consequence, the resonance frequency of the TE01δ mode changes. As planar resonator structures, we have employed quarter wave resonators each composed of a radially arranged slotline. Upon switching a MEMS located at the open end of the slotline resonator from the capacitive to the resistive state, the fundamental quarter wave resonance is transferred into a halfwave resonance. Due to intermodal coupling, the resonance frequency of the TE01δ mode changes. Tuning range and quality factors are determined experimentally for a test resonator at 2 GHz. In addition, numerical field simulation illustrating the intermodal coupling is discussed.
Keywords :
Q-factor; dielectric resonators; microcavities; micromechanical resonators; microswitches; tuning; 2 GHz; MEMS; TE mode; halfwave resonance; intermodal coupling; metal film; microelectromechanical switches; microwave applications; millimetre wave applications; numerical field simulation; planar resonator structures; quality factors; radially arranged slotline; resistive state; resonance frequency; slotline resonator; tuneable dielectric resonator structures; Dielectrics; Micromechanical devices; Q factor; Resonance; Resonant frequency; Slotline; Switches; Tellurium; Testing; Tuning;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on
Print_ISBN :
0-7803-8411-3
DOI :
10.1109/MSMW.2004.1345784