Title :
A high-resolution CMOS sigma-delta A/D converter with 320 kHz output rate
Author :
Rebeschini, Mike ; Van Bavel, Nicholas ; Rakers, Pat ; Greene, Robert ; Caldwell, Jim ; Haug, John
Author_Institution :
Motorola Inc., Schaumburg, IL, USA
Abstract :
A third-order switched-capacitor sigma-delta A/D converter is presented. The converter consists of three cascaded first-order sigma-delta modulators, and achieves 88 dB pk/rms S/(N+D) in a 160-kHz passband with a 10.24-MHz sampling rate. The high signal-to-noise ratio is maintained over this wide bandwidth by attenuating the quantization noise with a third-order noise-shaping function and a fourth-order comb decimation filter. A special autozeroed integrator with low pole error is required to achieve the 10.24-MHz sampling rate and high-order noise shaping simultaneously
Keywords :
CMOS integrated circuits; analogue-digital conversion; switched capacitor networks; 10.24 MHz; 160 kHz; 320 kHz; ADC; CMOS; autozeroed integrator; fourth-order comb decimation filter; high SNR; high-resolution; low pole error; monolithic IC; noise-shaping function; quantisation noise attenuation; sigma-delta A/D converter; sigma-delta modulators; switched-capacitor; third-order; Capacitors; Delta-sigma modulation; Digital filters; Digital modulation; Low pass filters; Noise shaping; Operational amplifiers; Quantization; Sampling methods; Silicon compounds;
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
DOI :
10.1109/ISCAS.1989.100337
