DocumentCode
1618521
Title
CESVM: Centered Hyperellipsoidal Support Vector Machine Based Anomaly Detection
Author
Rajasegarar, Sutharshan ; Leckie, Christopher ; Palaniswami, Marimuthu
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC
fYear
2008
Firstpage
1610
Lastpage
1614
Abstract
A challenge in using machine learning for tasks such as network intrusion detection and fault diagnosis is the difficulty in obtaining clean data for training in order to model the normal behavior of the system. Unsupervised anomaly detection techniques such as one class support vector machines (SVMs) have been introduced to overcome this difficulty. One class support vector machines model the normal or target data using non-linear surfaces in the input space while ignoring the anomalous data. Our approach to this problem is based on fitting a hyperellipsoid with a minimal effective radius, centered at the origin, around a majority of the data vectors in a higher dimensional space. We formulate this as a linear optimisation problem, which is advantageous in terms of its computational complexity. We demonstrate using real data from the great duck Island Project that our approach achieves better detection performance and flexibility in terms of parameter selection, compared to an earlier detection scheme using a quarter sphere SVM.
Keywords
computational complexity; image processing; learning (artificial intelligence); linear programming; security of data; support vector machines; Great Duck Island Project; anomaly detection; centered hyperellipsoidal support vector machine; earlier detection scheme; fault diagnosis; linear optimisation problem; machine learning; network intrusion detection; non-linear surfaces; quarter sphere SVM; Communications Society; Computer science; Data engineering; Electrical fault detection; Fault diagnosis; Intrusion detection; Kernel; Laboratories; Machine learning; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, 2008. ICC '08. IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2075-9
Electronic_ISBN
978-1-4244-2075-9
Type
conf
DOI
10.1109/ICC.2008.311
Filename
4533347
Link To Document