DocumentCode :
1618750
Title :
Acoustic emission measurement of partial discharges during electrical tree growth in XLPE cable insulation
Author :
Tian, Y. ; Lewin, P.L. ; Davies, A.E. ; Hathaway, G.M. ; Sutton, S.J. ; Swingler, S.G.
Author_Institution :
High Voltage Lab., Southampton Univ., UK
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
477
Lastpage :
480
Abstract :
Electrical treeing was initiated within XLPE insulation samples using a pin-plane electrode arrangement. The acoustic emission characteristics against test time until breakdown occurs, were investigated. Three dimensional φ-q-n patterns were used to present the discharge acoustic emission signals at different time periods during the breakdown process. Typical statistical operators, including skewness, kurtosis and cross correlation coefficients, were calculated. Obtained results indicate that a relationship may exist between skewness and the ageing process. Investigation also indicates that different experimental conditions such as pin tip radius,. pin-plane spacing and applied voltage, may determine the type of the resultant tree. The gas pressure within the tree channel and the space charge effect will also influence the breakdown process. The discharge signal magnitudes can vary significantly during the breakdown process, for this reason, breakdown cannot be predicted only by magnitude information
Keywords :
XLPE insulation; acoustic emission testing; ageing; insulation testing; partial discharge measurement; power cable insulation; statistical analysis; trees (electrical); XLPE insulation; acoustic emission characteristics; ageing; cross correlation coefficients; electric breakdown; gas pressure; kurtosis; pin tip radius; pin-plane electrode; pin-plane spacing; skewness; statistical operators; Acoustic emission; Acoustic measurements; Acoustic testing; Aging; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Partial discharges; Signal processing; Trees - insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
Conference_Location :
Eindhoven
Print_ISBN :
0-7803-6352-3
Type :
conf
DOI :
10.1109/ICSD.2001.955698
Filename :
955698
Link To Document :
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