Title :
A sub-nanosecond time-to-voltage converter and analog memory
Author :
Stevens, Andrew E. ; Van Berg, Richard P. ; Van der Spiegel, Jan ; Williams, Hugh H.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
Abstract :
A CMOS integrated circuit has been designed to measure the time interval between two digital voltage pulses. The measurement is stored as an analog voltage on a capacitor for later digitization. The targeted range of measurable times is 5-25 ns, with a resolution of 0.5 ns. An additional feature of the circuit is a storage depth of eight samples, i.e. eight consecutive time measurements may be recorded individually. Hence, the chip is a combination of a time-to-voltage converter (TVC) and an analog memory
Keywords :
CMOS integrated circuits; analogue storage; convertors; time measurement; 5 to 25 ns; CMOS integrated circuit; analog memory; consecutive time measurements; digital voltage pulses; monolithic IC; subnanosecond operation; time interval measurement; time-to-voltage converter; Analog memory; Capacitors; Current measurement; Detectors; Event detection; Integrated circuit measurements; Pulse measurements; Time measurement; Voltage; Wire;
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
DOI :
10.1109/ISCAS.1989.100342
