Title :
On the characterization of ESD properties of JEDEC trays
Author :
Gartner, Richard ; Stadler, Wolfgang ; Niemesheim, Josef
Author_Institution :
Infineon Technol., Neubiberg, Germany
Abstract :
One of the possibilities to safely transport ESD sensitive devices is the use of the so-called JEDEC trays. The paper describes and assesses the current situation for test methods to characterize their ESD properties. It also evaluates the risk for devices due to the inhomogeneity of the currently used materials for conductive/dissipative trays.
Keywords :
electrostatic discharge; integrated circuit testing; ESD property; JEDEC trays; conductive tray; dissipative tray; safely transport ESD sensitive devices; test methods; Electrical resistance measurement; Electrodes; Force; Materials; Probes; Surface resistance;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
