• DocumentCode
    1619127
  • Title

    On the characterization of ESD properties of JEDEC trays

  • Author

    Gartner, Richard ; Stadler, Wolfgang ; Niemesheim, Josef

  • Author_Institution
    Infineon Technol., Neubiberg, Germany
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    One of the possibilities to safely transport ESD sensitive devices is the use of the so-called JEDEC trays. The paper describes and assesses the current situation for test methods to characterize their ESD properties. It also evaluates the risk for devices due to the inhomogeneity of the currently used materials for conductive/dissipative trays.
  • Keywords
    electrostatic discharge; integrated circuit testing; ESD property; JEDEC trays; conductive tray; dissipative tray; safely transport ESD sensitive devices; test methods; Electrical resistance measurement; Electrodes; Force; Materials; Probes; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6635909