Title :
Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits
Author :
Mertens, Robert ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
Circuit simulation is proposed as an aid for design optimization of SCR-based ESD protection circuits. The compact models used in this work are validated by measurements. During simulation, the waveforms at the internal circuit nodes are probed; these indicate that the SCR causes most of the voltage overshoot and presents the greatest opportunity for overshoot reduction.
Keywords :
circuit simulation; electrostatic discharge; thyristors; ESD protection circuits; SCR; circuit simulation; design optimization; internal circuit nodes; overshoot reduction; trigger circuit;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
